نوع مقاله : مقاله پژوهشی
عنوان مقاله English
نویسندگان English
In this paper, in order to optimize the zinc sulfide film, three ZnS film samples were deposited with a magnetron sputtering system on an optical glass substrate with the trade name BK7. The effect of pressure on the optical, morphological and structural properties of the film was studied. Argon gas was used for plasma generation and sputtering process. Optical constants including refractive index and extinction coefficient of the ZnS film, film thickness and band gap were calculated using PRISA software. The refractive index of the films in the visible wavelength region is on average n=1.3 and the extinction coefficient is also in the same wavelength range k=1-4. In addition, the results show that the optical constants of the ZnS films and band gaps prepared at different pressures do not differ significantly from each other. In other words, the pressure parameter is not an effective factor in determining the optical properties of the ZnS film. On the other hand, pressure has a significant effect on the deposition rate, and the results show that there must be an optimal pressure to have the maximum growth rate.
کلیدواژهها English
Fang X., Zhai T., Gautam U.K., Li L., Wu L., Bando Y., Golberg D., ZnS nanostructures: From synthesis to applications, Prog. Mater. Sci., Vol. 56(2), 175–287, 2011.
D. L. Perry, “Low-Loss Multilayer Dielectric Mirrors”, Appl. Opt. 4, 987-991, 1965.
J. T. Cox, J. E. Waylonis, and W. R. Hunter, “Optical Properties of Zinc Sulfide in the Vacuum Ultraviolet,” J. Opt. Soc. Am. 49, 807-810, 1979.
R. P. Netterfield, “Refractive indices of zinc sulfide and cryolite in multilayer stacks”, Appl. Opt. 15, 1969-1973, 1969.
J. T. Cox and G. Hass, “Antireflection Coatings for Germanium and Silicon in the Infrared,” J. Opt. Soc. Am. 48, 677-680, 1958.
J. A Dobrowolski, P. D Grant, R. Simpson, and A. J. Waldorf, “Investigation of the evaporation process conditions on the optical constants of zirconia films”, Appl. Opt. 28, 3997, 1998.
C.D. Lokhande, V.S. Yermune, and S.H. Pawar, “Electrodepositions of CdS, ZnS and Cd1-xZnxS films,” Mater. Chem. Phys. 20, 283, 1998.
S. Yano, R. Schroeder, B. Ullrich, and H. Sakai, “Absorption and photocurrent properties of thin ZnS films formed by pulsed-laser deposition on quartz,” Thin Solid Films 423, 273-276, 2003.
L. X. Shao, K.H. Chang, and H.L. Hwang, “Zinc sulfide thin films deposited by RF reactive sputtering for photovoltaic applications,” Appl. Surf. Sci. 212, 305-310, 2003.
M. Oikkonen, T. Tuomi, and M. Luomajarvi, “Density of ZnS thin films grown by atomic layer epitaxy,” J. Appl. Phys. 63, 1070-1072, 1998.
S.K. Mandal, S. Chaudhuri, A.K. Pal, “Optical properties of nanocrystalline ZnS films prepared by high pressure magnetron sputtering,” Thin Solid Films 350, 209-213, 1999.
Li-Jian Meng and M. P. dos Santos, “Direct current reactive magnetron sputtered zinc oxide thin films - the effect of the sputtering pressure,” Thin Solid Films, 250, 26-32, 1994.
Mehak Yadav, Neelam Turk, Sanjay Kumar Swami*, Amanpal Singh, Vikrant Singh Rao, Neha Chaturvedi, Dinesh Kumar and Anuj Kumar, “Investigating impact of operating pressure of sputter deposited ZnO thin films for window layer in solar cells,” Physica Scripta, 100, 7, 2025.
S Jena, RB Tokas, S Thakur and D V Udupa, “PRISA: a user-friendly software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films,” Nano Express 2, 010008, 2021.
Viezbicke BD, Patel S, Davis B E and Birnie DP, “Evaluation of the Tauc method for optical absorption edge determination ZnO thin films as a model system,” Phys. Status Solidi b 252, 1700–10, 2015.
D Y Smith, Mitio Inokuti and William Karstens, “A generalized Cauchy dispersion formula and the refractivity of elemental semiconductors,” Journal of Physics: Condensed Matter 13, 3883-3893, 2021.
T. Amotchkina, M. Trubetskov, D. Hahner, V. Pervak, “Characterization of e-beam evaporated Ge, YbF3, ZnS, and LaF3 thin films for laser-oriented coatings,” Appl. Opt. 59, A40-A47, 2020.
Rodríguez, C.; Sandoval-Paz, M.; Cabello, G.; Flores, M.; Fernández, H.; Carrasco, C. “Characterization of ZnS thin films synthesized through a non-toxic precursors chemical bath,” Mater. Res. Bull. 60, 313–321, 2014.
Tran, T.K.; Park, W.; Tong, W.; Kyi, M.M.; Wagner, B.K.; Summers, C.J. “Photoluminescence properties of ZnS epilayers,” J. Appl. Phys., 81, 2803–2809, 1997.
M. Raposo, Q. Ferreira and P.A. Ribeiro, “A Guide for Atomic Force Microscopy Analysis of Soft-Condensed Matter,” Modern Research and Educational Topics in Microscopy, 1, 758-769, 2007.